提供Long test time, short test time, high speed, 大面积等符合各种application，
并对Logic Device/PKG. test等最优化的solution。
Specifications
Package Type
BGA, LGA, QFN, QFP, CSP, SOP, TSOP etc.
Available Pitch
0.25P~
Characteristics
- AP, CPU, GPU, PMIC, RF, Sensor, Mixed signal - Validation, SLT, ATE - Low Cres, High Speed, High Voltage Test Solution - No Ball Damage - Customizing Test
